| dc.contributor.author | Takusagawa, Fusao | |
| dc.date.accessioned | 2015-05-08T20:28:55Z | |
| dc.date.available | 2015-05-08T20:28:55Z | |
| dc.date.issued | 1987 | |
| dc.identifier.citation | Takusagawa, F. "A Simple Method of Absorption and Decay Correction in Intensities Measured by Area-detector X-ray Diffractometer." Journal of Applied Crystallography 20.3 (1987): 243-45. http://dx.doi.org/10.1107/S0021889887086771. | en_US |
| dc.identifier.uri | http://hdl.handle.net/1808/17675 | |
| dc.description | This is the published version. Copyright 1987 International Union of Crystallography. | en_US |
| dc.description.abstract | A simple numerical method has been developed to correct for absorption and decay effects in the intensities measured by area-detector X-ray diffractometers. Application of this method improves not only the internal consistency of symmetry-equivalent reflections, but also the agreement between the two independent data sets. | en_US |
| dc.publisher | International Union of Crystallography | en_US |
| dc.title | A simple method of absorption and decay correction in intensities measured by area-detector X-ray diffractometer | en_US |
| dc.type | Article | |
| kusw.kuauthor | Takusagawa, Fusao | |
| kusw.kudepartment | Molecular Biosciences | en_US |
| dc.identifier.doi | 10.1107/S0021889887086771 | |
| kusw.oaversion | Scholarly/refereed, publisher version | |
| kusw.oapolicy | This item does not meet KU Open Access policy criteria. | |
| dc.rights.accessrights | openAccess | |
