A simple method of absorption and decay correction in intensities measured by area-detector X-ray diffractometer

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Issue Date
1987Author
Takusagawa, Fusao
Publisher
International Union of Crystallography
Type
Article
Article Version
Scholarly/refereed, publisher version
Metadata
Show full item recordAbstract
A simple numerical method has been developed to correct for absorption and decay effects in the intensities measured by area-detector X-ray diffractometers. Application of this method improves not only the internal consistency of symmetry-equivalent reflections, but also the agreement between the two independent data sets.
Description
This is the published version. Copyright 1987 International Union of Crystallography.
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Citation
Takusagawa, F. "A Simple Method of Absorption and Decay Correction in Intensities Measured by Area-detector X-ray Diffractometer." Journal of Applied Crystallography 20.3 (1987): 243-45. http://dx.doi.org/10.1107/S0021889887086771.
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