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dc.contributor.authorLi, Qiang
dc.contributor.authorShen, Ting-Ting
dc.contributor.authorCao, Yan-Ling
dc.contributor.authorZhang, Kun
dc.contributor.authorYan, Shi-Shen
dc.contributor.authorTian, Yu-Feng
dc.contributor.authorKang, Shi-Shou
dc.contributor.authorZhao, Ming-Wen
dc.contributor.authorDai, You-Yong
dc.contributor.authorChen, Yan-Xue
dc.contributor.authorLiu, Guo-Lei
dc.contributor.authorMei, Liang-Mo
dc.contributor.authorWang, Xiao-Lin
dc.contributor.authorGrünberg, Peter
dc.contributor.authorYan, Shirley ShiDu
dc.date.accessioned2015-12-04T21:34:45Z
dc.date.available2015-12-04T21:34:45Z
dc.date.issued2014-01-23
dc.identifier.citationLi, Qiang, Ting-Ting Shen, Yan-Ling Cao, Kun Zhang, Shi-Shen Yan, Yu-Feng Tian, Shi-Shou Kang, Ming-Wen Zhao, You-Yong Dai, Yan-Xue Chen, Guo-Lei Liu, Liang-Mo Mei, Xiao-Lin Wang, and Peter Grünberg. "Spin Memristive Magnetic Tunnel Junctions with CoO-ZnO Nano Composite Barrier." Sci. Rep. Scientific Reports 4 (2014). http://dx.doi.org/10.1038/srep03835en_US
dc.identifier.urihttp://hdl.handle.net/1808/19139
dc.descriptionThis is the published version. Copyright 2015 Nature Publishing Groupen_US
dc.description.abstractThe spin memristive devices combining memristance and tunneling magnetoresistance have promising applications in multibit nonvolatile data storage and artificial neuronal computing. However, it is a great challenge for simultaneous realization of large memristance and magnetoresistance in one nanoscale junction, because it is very hard to find a proper spacer layer which not only serves as good insulating layer for tunneling magnetoresistance but also easily switches between high and low resistance states under electrical field. Here we firstly propose to use nanon composite barrier layers of CoO-ZnO to fabricate the spin memristive Co/CoO-ZnO/Co magnetic tunnel junctions. The bipolar resistance switching ratio is high up to 90, and the TMR ratio of the high resistance state gets to 8% at room temperature, which leads to three resistance states. The bipolar resistance switching is explained by the metal-insulator transition of CoO1−v layer due to the migration of oxygen ions between CoO1−v and ZnO1−v.en_US
dc.publisherNature Publishing Groupen_US
dc.titleSpin Memristive Magnetic Tunnel Junctions with CoO-ZnO Nano Composite Barrieren_US
dc.typeArticle
kusw.kuauthorYan, Shirley ShiDu
kusw.kudepartmentPharmacology & Toxicologyen_US
dc.identifier.doi10.1038/srep03835
kusw.oaversionScholarly/refereed, publisher version
kusw.oapolicyThis item meets KU Open Access policy criteria.
dc.rights.accessrightsopenAccess


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