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dc.contributor.authorChen, Jun
dc.contributor.authorOuyang, Lizhi
dc.contributor.authorRulis, Paul
dc.contributor.authorMisra, Anil
dc.contributor.authorChing, Wai-Yim
dc.date.accessioned2015-11-16T16:15:59Z
dc.date.available2015-11-16T16:15:59Z
dc.date.issued2005-12-16
dc.identifier.citationChen, Jun, Lizhi Ouyang, Paul Rulis, Anil Misra, and W. Y. Ching. "Complex Nonlinear Deformation of Nanometer Intergranular Glassy Films in β − Si 3 N 4." Phys. Rev. Lett. Physical Review Letters 95.25 (2005). http://dx.doi.org/10.1103/PhysRevLett.95.256103en_US
dc.identifier.urihttp://hdl.handle.net/1808/18919
dc.descriptionThis is the published version. Copyright 2005 American Physical Societyen_US
dc.description.abstractThe mechanical properties of a model of Y-doped intergranular glassy film in silicon nitride ceramics are studied by large-scale ab initio modeling. By linking directly to its electronic structure, it is shown that this microstructure has a complex nonlinear deformation under stress and Y doping significantly enhances the mechanical properties. The calculation of the electrostatic potential across the film supports the space charge model in ceramic microstructures.en_US
dc.publisherAmerican Physical Societyen_US
dc.titleComplex Nonlinear Deformation of Nanometer Intergranular Glassy Films in β−Si3N4en_US
dc.typeArticle
kusw.kuauthorMisra, Anil
kusw.kudepartmentCivil/Environ/Arch Engineeringen_US
dc.identifier.doi10.1103/PhysRevLett.95.256103
kusw.oaversionScholarly/refereed, publisher version
kusw.oapolicyThis item does not meet KU Open Access policy criteria.
dc.rights.accessrightsopenAccess


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