Complex refractive index tunability of graphene at 1550 nm wavelength

Xu, F.; Das, Susobhan; Gong, Youpin; Liu, Qingfeng; Chien, H.-C.; Chiu, H.-Y.; Wu, J.; Hui, Rongqing

Complex refractive index tunability of graphene at 1550 nm wavelength

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Issue Date

2015

Author

Xu, F.

Das, Susobhan

Gong, Youpin

Liu, Qingfeng

Chien, H.-C.

Chiu, H.-Y.

Wu, J.

Hui, Rongqing

Publisher

American Institute of Physics

Type

Article

Article Version

Scholarly/refereed, publisher version

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Abstract

The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO2/Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula.

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Citation

Xu, F., S. Das, Y. Gong, Q. Liu, H.-C. Chien, H.-Y. Chiu, J. Wu, and R. Hui. "Complex Refractive Index Tunability of Graphene at 1550 Nm Wavelength." Appl. Phys. Lett. Applied Physics Letters 106.3 (2015): 031109. http://dx.doi.org/10.1063/1.4906349

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