Complex refractive index tunability of graphene at 1550 nm wavelength

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Issue Date
2015Author
Xu, F.
Das, Susobhan
Gong, Youpin
Liu, Qingfeng
Chien, H.-C.
Chiu, H.-Y.
Wu, J.
Hui, Rongqing
Publisher
American Institute of Physics
Type
Article
Article Version
Scholarly/refereed, publisher version
Metadata
Show full item recordAbstract
The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO2/Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula.
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This is the published version. Copyright 2015 American Institute of Physics
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Citation
Xu, F., S. Das, Y. Gong, Q. Liu, H.-C. Chien, H.-Y. Chiu, J. Wu, and R. Hui. "Complex Refractive Index Tunability of Graphene at 1550 Nm Wavelength." Appl. Phys. Lett. Applied Physics Letters 106.3 (2015): 031109. http://dx.doi.org/10.1063/1.4906349
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