Sample heating in near-field scanning optical microscopy

View/ Open
Issue Date
2005-10-05Author
Erickson, Elizabeth S.
Dunn, Robert C.
Publisher
American Institute of Physics
Type
Article
Article Version
Scholarly/refereed, publisher version
Metadata
Show full item recordAbstract
Heating near the aperture of aluminumcoated,fiber opticnear-field scanning optical microscopy probes was studied as a function of input and output powers. Using the shear-force feedback method, near-field probes were positioned nanometers above a thermochromic polymer and spectra were recorded as the input power was varied. Excitation at 405 nm of a thin polymer film incorporating perylene and N-allyl-N-methylaniline leads to dual emission peaks in the spectra. The relative peak intensity is temperature sensitive leading to a ratiometric measurement, which avoids complications based solely on intensity. Using this method, we find that the proximal end of typical near-field probes modestly increase in temperature to 40–45 °C at output powers of a few nanowatts (input power of ∼0.15mW). This increases to 55–65 °C at higher output powers of 50 nW or greater (input power of ∼2–4mW). Thermal heating of the probe at higher powers leads to probe elongation, which limits the heating experienced by the sample.
Description
This is the published version, also available here: http://dx.doi.org/10.1063/1.2130388.
Collections
Citation
Erickson, Elizabeth S. & Dunn, Robert C. "Sample heating in near-field scanning optical microscopy." Appl. Phys. Lett. 87, 201102 (2005); http://dx.doi.org/10.1063/1.2130388.
Items in KU ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
We want to hear from you! Please share your stories about how Open Access to this item benefits YOU.