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dc.contributor.authorKrogmeier, Jeffrey R.
dc.contributor.authorDunn, Robert C.
dc.date.accessioned2014-12-05T16:14:47Z
dc.date.available2014-12-05T16:14:47Z
dc.date.issued2001-12-01
dc.identifier.citationKrogmeier, Jeffrey R. & Dunn, Robert C. "Focused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy." Appl. Phys. Lett. 79, 4494 (2001); http://dx.doi.org/10.1063/1.1430028.
dc.identifier.urihttp://hdl.handle.net/1808/16046
dc.descriptionThis is the published version, also available here: http://dx.doi.org/10.1063/1.1430028.
dc.description.abstractA probe for near-field scanning optical microscopy is demonstrated based on a high index glass sphere attached to the end of a conventional atomic force microscopy tip. The sphere is machined into a pyramid geometry using a focused ion beam(FIB) instrument, coated with aluminum to confine the excitation light, and milled further with the FIB to open an aperture at the end of the tip. Near-field fluorescence images of 50 nm fluorescent latex spheres reveal subdiffraction limit spatial resolution, illustrating the utility of these probes for near-field scanning optical microscopy.
dc.publisherAmerican Institute of Physics
dc.subjectFocused ion beam technology
dc.subjectNear-field scanning optical microscopy
dc.subjectApertures
dc.subjectAluminium
dc.subjectAtomic force microscopy
dc.titleFocused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy
dc.typeArticle
kusw.kuauthorKrogmeier, Jeffrey R.
kusw.kuauthorDunn, Robert C.
kusw.kudepartmentChemistry
dc.identifier.doi10.1063/1.1430028
kusw.oaversionScholarly/refereed, publisher version
kusw.oapolicyThis item does not meet KU Open Access policy criteria.
dc.rights.accessrightsopenAccess


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