| dc.contributor.author | Krogmeier, Jeffrey R. | |
| dc.contributor.author | Dunn, Robert C. | |
| dc.date.accessioned | 2014-12-05T16:14:47Z | |
| dc.date.available | 2014-12-05T16:14:47Z | |
| dc.date.issued | 2001-12-01 | |
| dc.identifier.citation | Krogmeier, Jeffrey R. & Dunn, Robert C. "Focused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy." Appl. Phys. Lett. 79, 4494 (2001); http://dx.doi.org/10.1063/1.1430028. | |
| dc.identifier.uri | http://hdl.handle.net/1808/16046 | |
| dc.description | This is the published version, also available here: http://dx.doi.org/10.1063/1.1430028. | |
| dc.description.abstract | A probe for near-field scanning optical microscopy is demonstrated based on a high index glass sphere attached to the end of a conventional atomic force microscopy tip. The sphere is machined into a pyramid geometry using a focused ion beam(FIB) instrument, coated with aluminum to confine the excitation light, and milled further with the FIB to open an aperture at the end of the tip. Near-field fluorescence images of 50 nm fluorescent latex spheres reveal subdiffraction limit spatial resolution, illustrating the utility of these probes for near-field scanning optical microscopy. | |
| dc.publisher | American Institute of Physics | |
| dc.subject | Focused ion beam technology | |
| dc.subject | Near-field scanning optical microscopy | |
| dc.subject | Apertures | |
| dc.subject | Aluminium | |
| dc.subject | Atomic force microscopy | |
| dc.title | Focused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy | |
| dc.type | Article | |
| kusw.kuauthor | Krogmeier, Jeffrey R. | |
| kusw.kuauthor | Dunn, Robert C. | |
| kusw.kudepartment | Chemistry | |
| dc.identifier.doi | 10.1063/1.1430028 | |
| kusw.oaversion | Scholarly/refereed, publisher version | |
| kusw.oapolicy | This item does not meet KU Open Access policy criteria. | |
| dc.rights.accessrights | openAccess | |
