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dc.contributor.authorSalandrino, Alessandro
dc.contributor.authorEngheta, Nader
dc.date.accessioned2016-10-17T16:30:26Z
dc.date.available2016-10-17T16:30:26Z
dc.date.issued2006-08-15
dc.identifier.citationSalandrino, A., & Engheta, N. (2006). Far-field subdiffraction optical microscopy using metamaterial crystals: Theory and simulations. Physical Review B, 74(7), 075103.en_US
dc.identifier.urihttp://hdl.handle.net/1808/21743
dc.description.abstractHere we suggest and explore theoretically an idea for a far-field scanless optical microscopy with a subdiffraction resolution. We exploit the special dispersion characteristics of an anisotropic metamaterial crystal that is obliquely cut at its output plane, or has a curved output surface, in order to map the input field distribution onto the crystal’s output surface with a compressed angular spectrum, resulting in a “magnified” image. This can provide a far-field imaging system with a resolution beyond the diffraction limits while no scanning is needed.en_US
dc.publisherAmerican Physical Societyen_US
dc.rights©2006 American Physical Societyen_US
dc.titleFar-field subdiffraction optical microscopy using metamaterial crystals: Theory and simulationsen_US
dc.typeArticleen_US
kusw.kuauthorSalandrino, Alessandro
kusw.kudepartmentElectrical Engineering and Computer Scienceen_US
dc.identifier.doi10.1103/PhysRevB.74.075103en_US
kusw.oaversionScholarly/refereed, publisher versionen_US
kusw.oapolicyThis item does not meet KU Open Access policy criteria.en_US
dc.rights.accessrightsopenAccess


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