dc.contributor.author | Hui, Rongqing | |
dc.contributor.author | Wan, Yueting | |
dc.contributor.author | Li, Jilu | |
dc.contributor.author | Jin, Sixuan | |
dc.contributor.author | Lin, J. Y. | |
dc.contributor.author | Jiang, Hongxing | |
dc.date.accessioned | 2015-11-13T21:12:04Z | |
dc.date.available | 2015-11-13T21:12:04Z | |
dc.date.issued | 2003 | |
dc.identifier.citation | Hui, R., Y. Wan, J. Li, S. X. Jin, J. Y. Lin, and H. X. Jiang. "Birefringence of GaN/AlGaN Optical Waveguides." Appl. Phys. Lett. Applied Physics Letters 83.9 (2003): 1698. http://dx.doi.org/10.1063/1.1606103 | en_US |
dc.identifier.uri | http://hdl.handle.net/1808/18910 | |
dc.description | This is the published version. Copyright © 2003 American Institute of Physics | en_US |
dc.description.abstract | We have experimentally studied the birefringence of wurtzite GaNgrown on a sapphire substrate. The measurements were done with single-mode GaN/AlGaN planar optical waveguides on c-plane grownheterostructure films. The refractive indices were found to be different for signal optical field perpendicular or parallel to the crystal c axis (n⊥≠n∥). More importantly, we found an approximately 10% change in index difference Δn=n∥−n⊥ with variation of the waveguide orientation in the a–b plane, and a 60° periodicity was clearly observed. This is attributed to the hexagonal structure of nitride materials. | en_US |
dc.publisher | American Institute of Physics | en_US |
dc.subject | Birefringence | en_US |
dc.title | Birefringence of GaN/AlGaN optical waveguides | en_US |
dc.type | Article | |
kusw.kuauthor | Hui, Rongqing | |
kusw.kudepartment | Electrical Engr & Comp Science | en_US |
dc.identifier.doi | 10.1063/1.1606103 | |
kusw.oaversion | Scholarly/refereed, publisher version | |
kusw.oapolicy | This item does not meet KU Open Access policy criteria. | |
dc.rights.accessrights | openAccess | |