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dc.contributor.authorHui, Rongqing
dc.contributor.authorWan, Yueting
dc.contributor.authorLi, Jilu
dc.contributor.authorJin, Sixuan
dc.contributor.authorLin, J. Y.
dc.contributor.authorJiang, Hongxing
dc.date.accessioned2015-11-13T21:12:04Z
dc.date.available2015-11-13T21:12:04Z
dc.date.issued2003
dc.identifier.citationHui, R., Y. Wan, J. Li, S. X. Jin, J. Y. Lin, and H. X. Jiang. "Birefringence of GaN/AlGaN Optical Waveguides." Appl. Phys. Lett. Applied Physics Letters 83.9 (2003): 1698. http://dx.doi.org/10.1063/1.1606103en_US
dc.identifier.urihttp://hdl.handle.net/1808/18910
dc.descriptionThis is the published version. Copyright © 2003 American Institute of Physicsen_US
dc.description.abstractWe have experimentally studied the birefringence of wurtzite GaNgrown on a sapphire substrate. The measurements were done with single-mode GaN/AlGaN planar optical waveguides on c-plane grownheterostructure films. The refractive indices were found to be different for signal optical field perpendicular or parallel to the crystal c axis (n⊥≠n∥). More importantly, we found an approximately 10% change in index difference Δn=n∥−n⊥ with variation of the waveguide orientation in the a–b plane, and a 60° periodicity was clearly observed. This is attributed to the hexagonal structure of nitride materials.en_US
dc.publisherAmerican Institute of Physicsen_US
dc.subjectBirefringenceen_US
dc.titleBirefringence of GaN/AlGaN optical waveguidesen_US
dc.typeArticle
kusw.kuauthorHui, Rongqing
kusw.kudepartmentElectrical Engr & Comp Scienceen_US
dc.identifier.doi10.1063/1.1606103
kusw.oaversionScholarly/refereed, publisher version
kusw.oapolicyThis item does not meet KU Open Access policy criteria.
dc.rights.accessrightsopenAccess


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