Characterization of Extragalactic 24 Micron Sources in the Spitzer First Look Survey
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Issue Date
2004-01-01Author
Yan, Lin
Helou, George
Fadda, D.
Marleau, Francine R.
Lacy, M.
Wilson, Graham Wallace
Soifer, B. T.
Drozdovsky, I.
Masci, F.
Armus, L.
Teplitz, H. I.
Frayer, D. T.
Surace, J.
Storrie-Lombardi, L. J.
Appleton, P. N.
Chapman, S. C.
Choi, P. I.
Fan, Fang
Heinrichsen, I.
Im, M.
Schmitz, M.
Shupe, D. L.
Squires, G.
Publisher
Astrophysical Journal Supplement Series
Type
Article
Article Version
Scholarly/refereed, publisher version
Metadata
Show full item recordDescription
This is the publisher's version, also available electronically from http://iopscience.iop.org/0067-0049/154/1/60/.
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Citation
Yan, Lin et al. (2004). "Characterization of Extragalactic 24 Micron Sources in the Spitzer First Look Survey." Astrophysical Journal Supplement, 151(1):60-65. http://www.dx.doi.org/10.1086/422824.
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