High-resolution shear-wave reflection profiling to image offset in unconsolidated near-surface sediments
Issue Date
2014-05-31Author
Bailey, Bevin
Publisher
University of Kansas
Format
144 pages
Type
Thesis
Degree Level
M.S.
Discipline
Geology
Rights
This item is protected by copyright and unless otherwise specified the copyright of this thesis/dissertation is held by the author.
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Show full item recordAbstract
S-wave reflection profiling has many theoretical advantages, when compared to P-wave profiling, such as high-resolution potential, greater sensitivities to lithologic changes and insensitivity to the water table and pore fluids, and could be particularly useful in near-surface settings. However, S-wave surveys can be plagued by processing pitfalls unique to near-surface studies such as interference of Love waves with reflections, and the stacking of Love waves as coherent noise, leading to possible misinterpretations of the subsurface. Two lines of S-wave data are processed and used to locate previously unknown faults in Quaternary sediments in a region where earthquake activity poses a threat to surface structures. This study provides clear examples of processing pitfalls such as Love waves with hyperbolic appearances on shot gathers, and a CMP section with coherent noise that is easily misinterpreted as reflections. This study demonstrates pros and cons of using SH reflection data in the near surface.
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- Geology Dissertations and Theses [232]
- Theses [3906]
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