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Characterization of Extragalactic 24 Micron Sources in the Spitzer First Look Survey
Yan, Lin Helou, George Fadda, D. Marleau, Francine R. Lacy, M. Wilson, Graham Wallace Soifer, B. T. Drozdovsky, I. Masci, F. Armus, L.
Yan, Lin
Helou, George
Fadda, D.
Marleau, Francine R.
Lacy, M.
Wilson, Graham Wallace
Soifer, B. T.
Drozdovsky, I.
Masci, F.
Armus, L.
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This is the publisher's version, also available electronically from http://iopscience.iop.org/0067-0049/154/1/60/.
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2004-01-01
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Astrophysical Journal Supplement Series
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Yan, Lin et al. (2004). "Characterization of Extragalactic 24 Micron Sources in the Spitzer First Look Survey." Astrophysical Journal Supplement, 151(1):60-65. http://www.dx.doi.org/10.1086/422824.