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Complex refractive index tunability of graphene at 1550 nm wavelength
Xu, F. Das, Susobhan Gong, Youpin Liu, Qingfeng Chien, H.-C. Chiu, H.-Y. Wu, J. Hui, Rongqing
Xu, F.
Das, Susobhan
Gong, Youpin
Liu, Qingfeng
Chien, H.-C.
Chiu, H.-Y.
Wu, J.
Hui, Rongqing
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Abstract
The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO2/Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula.
Description
This is the published version. Copyright 2015 American Institute of Physics
Date
2015
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Publisher
American Institute of Physics
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Keywords
Graphene, Reflectivity, Electric measurements, Refractive index, Chemical potential
Citation
Xu, F., S. Das, Y. Gong, Q. Liu, H.-C. Chien, H.-Y. Chiu, J. Wu, and R. Hui. "Complex Refractive Index Tunability of Graphene at 1550 Nm Wavelength." Appl. Phys. Lett. Applied Physics Letters 106.3 (2015): 031109. http://dx.doi.org/10.1063/1.4906349