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Microwave-induced phase escape in a Josephson tunnel junction
Guozhu, Sun Yiwen, Wang Junyu, Cao Jian, Chen Zhengming, Ji Lin, Kang Weiwei, Xu Yang, Yu Han, Siyuan Peiheng, Wu
Guozhu, Sun
Yiwen, Wang
Junyu, Cao
Jian, Chen
Zhengming, Ji
Lin, Kang
Weiwei, Xu
Yang, Yu
Han, Siyuan
Peiheng, Wu
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Abstract
We perform both theoretical and experimental investigations on the phase escape of a current-biased Josephson tunnel junction under microwave irradiation. The switching current distributions exhibit abundant nonlinear behaviors depending on the power and frequency of the applied microwave. We present a model to describe the behavior of the primary peak in the switching current distribution, which is confirmed by our experimental results. The obtained features can be used to characterize the damping parameter of Josephson junctions.
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This is the published version, also available here: http://dx.doi.org/10.1103/PhysRevB.77.104531.
Date
2008-03-28
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American Physical Society
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Sun Guozhu, Wang Yiwen, Cao Junyu, Chen Jian, Ji Zhengming, Kang Lin, Xu Weiwei, Yu Yang, Han Siyuan, and Wu Peiheng." Microwave-induced phase escape in a Josephson tunnel junction." Phys. Rev. B 77, 104531 – Published 28 March 2008. http://dx.doi.org/10.1103/PhysRevB.77.104531.