Microwave-induced phase escape in a Josephson tunnel junction
Issue Date
2008-03-28Author
Guozhu, Sun
Yiwen, Wang
Junyu, Cao
Jian, Chen
Zhengming, Ji
Lin, Kang
Weiwei, Xu
Yang, Yu
Han, Siyuan
Peiheng, Wu
Publisher
American Physical Society
Type
Article
Article Version
Scholarly/refereed, publisher version
Metadata
Show full item recordAbstract
We perform both theoretical and experimental investigations on the phase escape of a current-biased Josephson tunnel junction under microwave irradiation. The switching current distributions exhibit abundant nonlinear behaviors depending on the power and frequency of the applied microwave. We present a model to describe the behavior of the primary peak in the switching current distribution, which is confirmed by our experimental results. The obtained features can be used to characterize the damping parameter of Josephson junctions.
Description
This is the published version, also available here: http://dx.doi.org/10.1103/PhysRevB.77.104531.
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Citation
Sun Guozhu, Wang Yiwen, Cao Junyu, Chen Jian, Ji Zhengming, Kang Lin, Xu Weiwei, Yu Yang, Han Siyuan, and Wu Peiheng." Microwave-induced phase escape in a Josephson tunnel junction." Phys. Rev. B 77, 104531 – Published 28 March 2008. http://dx.doi.org/10.1103/PhysRevB.77.104531.
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